CY8C24123A
CY8C24223A
CY8C24423A
Document Number: 38-12028 Rev. *V Page 43 of 71
When bypassed by a capacitor on P2[4], the noise of the analog ground signal distributed to each block is reduced by a factor of up
to 5 (14 dB). This is at frequencies above the corner frequency defined by the on-chip 8.1 K resistance and the external capacitor.
Figure 14. Typical AGND Noise with P2[4] Bypass
At low frequencies, the opamp noise is proportional to 1/f, power independent, and determined by device geometry.
At high frequencies, increased power level reduces the noise spectrum level.
Table 35. 2.7-V AC Operational Amplifier Specifications
Symbol Description Min Typ Max Units
t
ROA
Rising settling time from 80% of V to 0.1% of V
(10 pF load, unity gain)
Power = low, Opamp bias = low
Power = medium, Opamp bias = high
–
–
–
–
3.92
0.72
µs
µs
t
SOA
Falling settling time from 20% of V to 0.1% of V
(10 pF load, unity gain)
Power = low, Opamp bias = low
Power = medium, Opamp bias = high
–
–
–
–
5.41
0.72
µs
µs
SR
ROA
Rising slew rate (20% to 80%) (10 pF load, unity gain)
Power = low, Opamp bias = low
Power = medium, Opamp bias = high
0.31
2.7
–
–
–
–
V/µs
V/µs
SR
FOA
Falling slew rate (20% to 80%) (10 pF load, unity gain)
Power = low, Opamp bias = low
Power = medium, Opamp bias = high
0.24
1.8
–
–
–
–
V/µs
V/µs
BW
OA
Gain bandwidth product
Power = low, Opamp bias = low
Power = medium, Opamp bias = high
0.67
2.8
–
–
–
–
MHz
MHz
E
NOA
Noise at 1 kHz (Power = medium, Opamp bias = high) – 100 – nV/rt-Hz
100
1000
10000
0.001 0.01 0.1 1 10 100Fr eq (kHz)
nV/rtHz
0
0.01
0.1
1.0
10
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